Description: Silicon AFM probes are designed for contact mode applications. These probes feature shorter cantilevers, which provide better sensitivity without compromising on spring constant requirements. 5 AFM Tips per pack.
Material : N-type Silicon
Cantilevel Geometry :Pyramidal
Cantilever Number : 1
Cantilever Thickness : 1 µm
Back Side Coating: None
Top Layer Coating: None
| | Each tip contains 1 caivers with the following properties: | Tip | Shape | Length | Width | Force Const. | Res. Freq. | Tip Raidus | | 1 | Pyramidal | 225 µm | 43 µm | 0.10 N/m | 28 kHz | 6 nm | | |
